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STC P - 2016 Annual Report

The Scientific Technical Committee Precision Engineering and Metrology (STC P) had two meetings in 2016 - on February 18th, 2016 in Paris and on August 26th, 2016 in Guimaraes, Portugal. The STC P meetings were attended by 53 members and 20 invited guests in Paris and 58 members and 14 invited guests in Guimaraes
Details of the technical presentations and discussions at the 2016 STC P meetings are in the minutes written by Andreas Archenti, STC P Secretary. The minutes are available to CIRP members at the CIRP website.
R. Schmitt, M. Peterek, E. Morse, W. Knapp, M. Galetto, F. Härtig, G. Goch, B. Hughes, A. Forbes, T. Estler are the authors of the 2016 STC P keynote paper entitled “Advances in Large-Scale Metrology - Review and Future Trends”. STC P also hosted the cross STC keynote paper entitled "Process Chains for High-Precision Components with Micro-Scale Features" with authors of E. Uhlmann, B. Mullany, D. Biermann, K. Rajurkar, T. Hausotte, E. Brinksmeier. The keynote presentations were delivered by R. Schmitt and E. Uhlmann, respectively, in the Plenary Session. There were no discussions or questions raised in the STC-P August meeting for both keynote presentations. STC-P thanked the authors of the two keynote papers for their efforts.
The STC P paper session was held on August 22nd and 23rd. It included 11 interesting paper presentations, covering a wide range of precision engineering and metrology related topics. The papers dealt with topics on 1) machining and related metrology ("Measurement of a tool wear profile using confocal fluorescence microscopy of the cutting fluid layer" by Y. Takaya, "An imaging system with a large depth of field based on an overlapped micro-lens array” by K, Pang, "Virtual spindle based tool servo diamond turning of discontinuously structured microoptics arrays" by S. To, 2) machine tool metrology (“Automated thermal main spindle & B-axis error compensation of 5-axis machine tools” by J. Mayr, “Measurement of thermal influence on a two-dimensional motion trajectory using a tracking interferometer” by S. Ibaraki, 3) Modelling and evaluation (“Gaussian Process Based Multi-scale Modelling for Precision Measurement of Complex Surfaces” by Y. Yin, “Uncertainty evaluation of distributed Large-Scale-Metrology systems by a Monte Carlo approach” by M. Galetto, “Economic benefits of metrology in manufacturing” by E. Savio, 4) calibration (“3D artefact for concurrent scale calibration in Computed Tomography” by A. Stolfi, “Self-Calibration Method for a Ball Plate Artefact on a CMM” by D. Stöbener, “Implementation of straightness measurements at the Nanometer Comparator” by H. Bosse.

Wei Gao